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Impact of selected parameters on results of dielectric frequency response

Ondřej Kabot
VŠB-TUO, CEET, ENET Centre

Jan Fulneček
VŠB-TUO, CEET, ENET Centre

Denisa Fulnečková


     Last modified: 2022-06-20

Abstract
In the field of electrical device diagnostics, there are always new methods being developed and the older ones are being improved. Sometimes already used method in different field is improved to the point it can be used in another one. The same can be said about dielectric spectroscopy, which was previously used to analyse properties of dielectric materials and now can be used for complex diagnostics of whole devices. This article focuses on the impact of selected parameters of this method on final results of the measurement.
 

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